David Nott: Multi-phase excursion set image models

Excursion sets of random fields, which are obtained by
``thresholding'' a random field at some level, can be used
to define random set models for binary images. Some
image models based on excursion sets which are appropriate
for multi-phase image data will be discussed. The methods
will be applied to Diggle's heather incidence data and to
some images of core samples of sulphide ores.